JPH0438509U - - Google Patents

Info

Publication number
JPH0438509U
JPH0438509U JP8054490U JP8054490U JPH0438509U JP H0438509 U JPH0438509 U JP H0438509U JP 8054490 U JP8054490 U JP 8054490U JP 8054490 U JP8054490 U JP 8054490U JP H0438509 U JPH0438509 U JP H0438509U
Authority
JP
Japan
Prior art keywords
light
isotropic material
half mirror
linearly polarized
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8054490U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8054490U priority Critical patent/JPH0438509U/ja
Publication of JPH0438509U publication Critical patent/JPH0438509U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP8054490U 1990-07-27 1990-07-27 Pending JPH0438509U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8054490U JPH0438509U (en]) 1990-07-27 1990-07-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8054490U JPH0438509U (en]) 1990-07-27 1990-07-27

Publications (1)

Publication Number Publication Date
JPH0438509U true JPH0438509U (en]) 1992-03-31

Family

ID=31625706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8054490U Pending JPH0438509U (en]) 1990-07-27 1990-07-27

Country Status (1)

Country Link
JP (1) JPH0438509U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126192A (ja) * 2004-10-26 2006-05-18 Mitsutoyo Corp モノリシック直交位相検出器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126192A (ja) * 2004-10-26 2006-05-18 Mitsutoyo Corp モノリシック直交位相検出器

Similar Documents

Publication Publication Date Title
JP2865880B2 (ja) 干渉計センサ
JP2004205500A (ja) 複屈折測定装置及び複屈折測定方法
JPH05142141A (ja) 薄膜測定装置
CN111562001B (zh) 一种双路四通道偏振干涉成像系统及方法
JPH0438509U (en])
US4346999A (en) Digital heterodyne wavefront analyzer
US4105335A (en) Interferometric optical phase discrimination apparatus
CN113804646B (zh) 近红外傅里叶变换偏振光谱仪
JP3795191B2 (ja) 透明薄板測定用干渉計
TWI866782B (zh) 偏振型雙光束法布里培洛干涉儀
JPH0419522B2 (en])
JPS6157805U (en])
JPS6326763Y2 (en])
JP2665917B2 (ja) 4ビームスプリッタプリズム
JPS6433602U (en])
JPH027508U (en])
JPS6427648U (en])
JPS60263866A (ja) 光電界センサ
JPH01147306A (ja) 膜厚測定装置
JPS59162646U (ja) 光学的複屈折量測定装置
JP2505823Y2 (ja) レ―ザ変位計
JPS6083943U (ja) 光デイスクの複屈折検査装置
JPS6137569B2 (en])
JPH0549922B2 (en])
JPS6029621A (ja) 複屈折測定方法およびその装置